X-ray-ultraviolet beam splitters for the Michelson interferometer - Institut d'Optique Graduate School
Journal Articles Applied optics Year : 2002

X-ray-ultraviolet beam splitters for the Michelson interferometer

Abstract

With the aim of realizing a Michelson interferometer working at 13.9 nm, we have developed a symmetrical beam splitter with multilayers deposited on the front and back sides of a silicon nitride membrane. On the basis of the experimental optical properties of the membrane, simulations have been performed to define the multilayer structure that provides the highest reflectivity-transmission product. Optimized Mo-Si multilayers have been successfully deposited on both sides of the membrane by use of the ion-beam sputtering technique, with a thickness-period reproducibility of 0.1 nm. Measurements by means of synchrotron radiation at 13.9 nm and at an angle of 45° provide a reflectivity of 14.2% and a transmission of 15.2% for a 60% s-polarized light, close to the simulated values. Such a beam splitter has been used for x-ray laser Michelson interferometry at 13.9 nm. The first interferogram is discussed.
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Dates and versions

hal-00875413 , version 1 (22-10-2013)

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Franck Delmotte, Marie-Françoise Ravet, Françoise Bridou, Françoise Varniere, Philippe Zeitoun, et al.. X-ray-ultraviolet beam splitters for the Michelson interferometer. Applied optics, 2002, 41 (28), pp.5905-5912. ⟨10.1364/AO.41.005905⟩. ⟨hal-00875413⟩
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