Circuit faults Soft errors Switches Logic gates BIST Phase noise Microprocessors Delays Testing Digital ATE FPGA Noise Integrated circuit design Machine learning Security Integrated circuit interconnections Modeling Accelerometer Neutron Robustness Estimation RSA Test efficiency SRAM Hardware security 1-bit acquisition Variability Sensors Education Noise measurement Integrated circuits MEMS ATPG VLSI Hardware 3D integration Performance Through-silicon vias Indirect testing Fault attacks CMOS Magnetic tunneling Monitoring Simulation Fault tolerance Software Power consumption Design space exploration Machine Learning Computer architecture Embedded systems Carbon nanotubes Test Reliability Silicon MRAM Process variability Clocks Internet of Things Spintronics STT-MRAM Cryptography Fiabilité Fault injection Integrated circuit modeling Protons Transistors Automatic test pattern generation Integrated circuit reliability Atmospheric neutrons RF test Fault Tolerance Power supplies Countermeasures Neutrons Energy efficiency Single event upset SEU SoC Failure analysis Approximate Computing Integrated circuit testing Approximate computing SEU ZigBee Digital signal processing Test and Security Test cost reduction DPA Cross section Soft error Radiation Fault Injection Design Power demand Crosstalk Random access memory IoT RF integrated circuits AES Sécurité