Capillary condensation XRD Pb centers Growth 17Op Aluminum Zinc oxide Periodic multilayer Alloys Thin films SiC NRP ADSORPTION DESORPTION HYSTERESIS Ion implantation 15N RBS 18O Adsorbed layers Gold Nickel Passivation XPS Raman spectroscopy Pulsed laser deposition Interface defects Metal-insulator transition Stable isotopic tracing Ageing Acoustic Topological insulators Low energy electron diffraction LEED Adsorption Isotherms Silicon Silica Photoluminescence Channeling Hysteresis 27Alda EPR 3C-SiC Defects HfO2 Sputtering Multilayer Diffusion Ion beam analysis Magnetic anisotropy Rutherford backscattering spectrometry RBS Silicon carbide Nitridation PIXE 6855Jk Evaluation 7550Ee Magnetization curves Adsorption 27Ald p&α Silicon Carbide Transparent conductive oxide TCO 13C Charge exchange Epitaxy Density functional theory Annealing Magnetic semiconductors Kossel diffraction Nuclear reaction analysis Oxidation Topological defects Nanoparticles Alloy Nanostructures Isotopic Tracing Aluminium 7630Lh 17O GaMnAs Atomic Layer Deposition ALD 8140Ef Ferromagnetic resonance Oxygen deficiency 27Aldp AC susceptibility Thin film Indium oxide 18O resonance Al2O3 Gallium oxide 17Opp 2H Energy loss 7550Pp Nuclear resonance profiling NRP Measurement AFM ALD Epitaxial growth Auger electron spectroscopy AES X-ray diffraction Acoustic propreties of solid