Static and LFN/RTN Local and Global Variability Analysis Using an Addressable Array Test Structure - CMNE
Conference Papers Year : 2023

Static and LFN/RTN Local and Global Variability Analysis Using an Addressable Array Test Structure

Abstract

The use of an addressable array test structure designed on a 28 nm FD-SOI technology for the variability analysis of static, low frequency noise (LFN) and Random Telegraph Noise (RTN) matching is presented. The experimental setup was validated, and a statistical analysis of the above electrical quantities is provided. Using such structures, combined with a switching matrix, local and global variability analysis can be performed while significantly increasing the number of samples, thus enabling a better description of the variations in LFN and RTN, especially when RTN signatures can be scarce. We show that local variations dominate the noise variability compared to global variations.
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Dates and versions

hal-04305404 , version 1 (24-11-2023)

Identifiers

Cite

Owen Gauthier, Sébastien Haendler, Ronan Beucher, Patrick Scheer, Quentin Rafhay, et al.. Static and LFN/RTN Local and Global Variability Analysis Using an Addressable Array Test Structure. 2023 35th International Conference on Microelectronic Test Structure (ICMTS), Mar 2023, Tokyo, Japan. pp.1-6, ⟨10.1109/ICMTS55420.2023.10094087⟩. ⟨hal-04305404⟩
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